Our x-ray diffraction facility houses two x-ray diffractometers as well as a suite of analysis tools to structurally characterise powders, thin films and coating, solid materials and single crystals.
Our aim is to produce world-class structural analysis on a wide range of materials to improve the understanding of a materials physical and chemical behaviour such as electrical, thermal, magnetic and mechanical properties. By determining the spacing between crystal lattice planes and the length scales over which they persist, we are able to determine the 3D atomic structure of materials.
We have several x-ray diffractometers which can be operated in many different modes. All modes reveal different information about the material such as:
- Residual stress analysis - Determine residual stress within the structure to better understand the physical properties
- Texture (preferred orientation) analysis - Study preferential ordering and epitaxial growth of crystallites (such as thin films or single crystals)
- Bragg-Brentano - Phase identification in crystalline and non-crystalline materials as well as quantification of phases within mixtures
- Line broadening - Determination of crystallite size
- Hot and cold stage analysis - To study the effect of different temperatures on the structure and crystalline nature of a material
- Reflectometry – To characterise surfaces, thin films and multilayers
Specialist Research Areas
- Thin films
- Composite materials
Working with business
If you require x-ray diffraction analysis we can advise on the most appropriate modes of operation for you needs at the right cost. We have highly trained and qualified personnel with the necessary experience to provide high quality, friendly and comprehensive service to both academic and industrial users.
To discuss your requirements please contact:
Dr Faye Esat, Facility Manager
t: +44(0)113 343 4142